| 摘要 |
A test fixture for facilitating connection between a pin grid array, such as those found on multi-lead electronic components, and the test leads of a diagnostic device, useful for testing such components after they are mounted on printed circuit boards. A base element is formed of transparent plastic material and carries an array of connectors, the number and arrangement of which depend upon the component to be tested. Each connector includes a test lead connector, adapted for attachment to a test lead, and a pin engagement member, adapted for making and retaining physical contact with a component pin. The pin engagement member is carried resiliently in the connector body, able to move longitudinally therein. A resilient seal means extends around the outer periphery of the underside of the base member, defining a well in the space below the base member. The seal means may include multiple resilient seal layers, separated by stiffeners. In operation, the fixture is aligned with the pin grid array protruding through the printed circuit board on the side of such board opposite the component. A vacuum system introduces subatmospheric pressure into the well, forcing the fixture against the printed circuit board and causing the connectors to make contact with the component pins.
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