发明名称
摘要 PURPOSE:To mount and demount a probe automatically by providing a mechanism which moves the probe from a rest base to a tip by a probe pressing-in mechanism and mounts a sublance at a lower end, and further demounts a used probe from the sublance. CONSTITUTION:Plural probes 1 are placed on the rest base 2 and thepressing-in machine 3 is moved to the tip part of the device by a sliding mechanism 8. Then, a sublance insertion guide 5 is put in operation to insert a probe 1 into the tip of the sublance 4. Then, the sublance 4 is elevated and rotated, and the probe 1 is lowered into a converter, etc., to sample molten steel and measure its temperature.The sublance 14 is elevated and the probe is moved from the temperature measurement position to a mounting/demounting position. The probe 1 is demounted from the sublance 4 by a probe clamping mechanism 6 and recovered. Thus, the probe is mounted and demounted automatically, and the facilities are compact and applicable to existent facilities.
申请公布号 JPH0130106(B2) 申请公布日期 1989.06.16
申请号 JP19840141269 申请日期 1984.07.06
申请人 SUMITOMO METAL IND 发明人 SASAKI TSUYOSHI;TACHIBANA KENZO
分类号 C21C5/46;G01N1/10;G01N1/12;G01N33/20 主分类号 C21C5/46
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