发明名称 Semiconductor memory circuit with sensing arrangement free from malfunction.
摘要 <p>A dynamic memory circuit which can operate at a high speed and with a reduced amount of noise is disclosed. The memory circuit includes word lines and a pair of dummy word lines arranged in rows, a plurality of bit line pairs arranged in columns, a plurality of memory cells, dummy capacitors connected between the dummy word lines and the bit line pairs and a plurality of transfer gate pairs inserted between the bit line pairs and the sense amplifiers.</p>
申请公布号 EP0318927(A2) 申请公布日期 1989.06.07
申请号 EP19880119892 申请日期 1988.11.29
申请人 NEC CORPORATION 发明人 FUJII, TAKEO
分类号 G11C11/401;G11C11/409;G11C11/4091 主分类号 G11C11/401
代理机构 代理人
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