发明名称 CIRCUIT TESTING DEVICE
摘要 PURPOSE:To classify differences in response time by small time difference by supplying a strobe pulse through an independent signal line and leading out response output signals at different timing. CONSTITUTION:A level comparator 300 is supplied with a response output signal from a circuit to be tested at an input terminal 301 to decide whether or not an H level and an L level are normal by comparison. Then, a logical comparator group 400 decides whether or not there is the response output signal from the comparator 300 by signal detecting circuits 402 and 403 with strobe pulses STRB1 and STRB2 sent through different transmission lines 415 and 416 and logic comparators 402A and 402B compare the decision result with an expected value signal to decide whether or not it is coincident. Thus, the response time differences are classified by small time differences.
申请公布号 JPH01138477(A) 申请公布日期 1989.05.31
申请号 JP19870296995 申请日期 1987.11.24
申请人 ADVANTEST CORP 发明人 SATO KAZUHIKO;NISHIURA JUNJI;TAKAHASHI KEIICHI
分类号 G01R31/28;G01R19/165;G01R31/3193 主分类号 G01R31/28
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