发明名称 TREATER FOR SEMICONDUCTOR SUBSTRATE
摘要 <p>PURPOSE:To prevent the lowering of the yield of products due to the contamination of a wafer by installing a rolling mechanism angularly turning a semiconductor substrate and positioning the specific peripheral section of the substrate at a fixed position and a conveying mechanism sucking one part of the specific periphery of the positioned substrate in a vacuum and carrying in and out the substrate. CONSTITUTION:When a wafer chuck 1 is rotated and the notch of a disk 5 is revolved up to the position of a sensor 6, light from a projecting section light-shielded by the rotating disk 5 reaches a light-receiving section, and the direction of the rotating disk is sensed by the reaching of light and the revolution of the chuck 1 is stopped. The specific peripheral section 2a of a wafer 2 is sucked by the nose of a load arm 3, and carried onto the chuck 1. The wafer 2 is sucked onto the chuck 1 in a vacuum and turned, a photo-resist is applied and developed at that time, and the wafer chuck is stopped when the notch of the rotating disk 5 reaches at the position of a sensor 7. An unloading arm 4 is rotated, the specific peripheral section 2a of the wafer 2 is sucked under the vacuum, and the wafer is conveyed. Accordingly, the contacting section of a conveying mechanism to the wafer at the time of conveyance is limited to one position.</p>
申请公布号 JPH01129436(A) 申请公布日期 1989.05.22
申请号 JP19870289076 申请日期 1987.11.16
申请人 NEC CORP 发明人 FUJIWARA MAKOTO
分类号 H01L21/677;B65G49/07;B65H5/14;B65H5/18;H01L21/68 主分类号 H01L21/677
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