TEST CIRCUIT FOR INTEGRATED CIRCUIT,申请号JP19870273171-传众专利搜索

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发明名称	TEST CIRCUIT FOR INTEGRATED CIRCUIT
摘要
申请公布号	JPH01116466(A)	申请公布日期	1989.05.09
申请号	JP19870273171	申请日期	1987.10.30
申请人	NEC CORP	发明人	OKI HIDETAKA
分类号	G01R31/28;G01R31/26;H01L21/66	主分类号	G01R31/28
代理机构		代理人
主权项
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