发明名称 |
X-ray examination apparatus and method |
摘要 |
An X-ray examination apparatus and method that provides fast and accurate control of the X-ray dose by combining a fast and inaccurate sensor dose signal for an X-ray sensor and a slow and accurate detector dose signal from an X-ray detector. The combination of the signals takes into account the delay between the two signals so that they are measured at essentially the same time.
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申请公布号 |
US7035376(B2) |
申请公布日期 |
2006.04.25 |
申请号 |
US20040498178 |
申请日期 |
2004.06.09 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
WOLFS PETER BAS ANTON |
分类号 |
G21K5/00;H05G1/44;A61B6/00;G01T1/02;G01T1/17;G21K5/02 |
主分类号 |
G21K5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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