发明名称 |
X-ray particle size analyzer. |
摘要 |
An x-ray sedimentation particle size analyzer in which data is taken only at particular positions along the sedimentation cell, and each such position is individually calibrated. Presentation of the data in the form of a particle size distribution curve can be accomplished very accurately using interpolation techniques. The sedimentation cell design is free of the effects of undesirable density gradients capable of detecting and removing bubbles, capable of attaining a highly uniform dispersion of sample prior to sedimentation, and including a safety interlock device for blocking x-ray projection when the cell is being accessed.
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申请公布号 |
EP0314467(A2) |
申请公布日期 |
1989.05.03 |
申请号 |
EP19880310091 |
申请日期 |
1988.10.27 |
申请人 |
MICROMERITICS INSTRUMENT CORPORATION |
发明人 |
OLIVIER, JAMES P.;KANE, MARY F.;ORR, CLYDE, DR. JR.;LAUGHINGHOUSE, CHARLES L.;WAGNER, JACK J.;TIDWELL, SAMUEL VINCE |
分类号 |
G01N23/00;A61B5/145;A61B5/1459;A61B5/1491;G01N1/00;G01N15/02;G01N15/04;G01N23/02;G01N23/06;G01N23/10 |
主分类号 |
G01N23/00 |
代理机构 |
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代理人 |
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地址 |
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