发明名称 |
Scan test apparatus for digital systems having dynamic random access memory |
摘要 |
A scan test apparatus is constructed to scan test a digital system having a memory system containing dynamic random access memory (DRAM). The scan test apparatus is given access to the memory system so that test control signals can preset the refresh counter (for the DRAM) and initialize the memory for later testing. |
申请公布号 |
US4827476(A) |
申请公布日期 |
1989.05.02 |
申请号 |
US19870039548 |
申请日期 |
1987.04.16 |
申请人 |
TANDEM COMPUTERS INCORPORATED |
发明人 |
GARCIA, DAVID J. |
分类号 |
G11C11/401;G01R31/319;G11C29/00;G11C29/14;G11C29/32;G11C29/48;(IPC1-7):G01R31/28 |
主分类号 |
G11C11/401 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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