发明名称 EVALUATING METHOD FOR SEMICONDUCTOR LASER
摘要 PURPOSE:To observe an oscillation spectrum in the transient state of a DFB laser and to accurately evaluate transmission characteristic by applying a current for generating only a first optical pulse of a relaxation oscillation to the laser. CONSTITUTION:A transmission characteristic measuring pulse pattern generator 22 applies a DC bias current for generating only a first optical pulse of a relaxation oscillation to a DFB laser 24 and an electric pulse to be superposed thereon through a terminal T1. Then, the generation of an FP mode is confirmed. Thereafter, a channel selector 30 is switched to an optical fiber 40b, and the oscillation spectrum of the laser 24 is observed. Since an improper component for deteriorating the transmission characteristic and a proper component have different oscillation spectra of the FP mode, the component is proper or not is judged based on the depth of the FP mode.
申请公布号 JPH01102977(A) 申请公布日期 1989.04.20
申请号 JP19870260582 申请日期 1987.10.15
申请人 FUJITSU LTD 发明人 KAMITE KIYOTSUGU
分类号 G01R31/26;H01L21/66;H01S5/00;H01S5/042 主分类号 G01R31/26
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