发明名称 SYSTEM FOR SUPPORTING ANALYSIS OF DEFECTIVE CONTROL OF ELECTRONIC COMPUTER
摘要 PURPOSE:To shorten a real device control period needed for the confirmation of the device working by using a service processor supporting the analysis of a defect for study of the defect factors of an electronic computer to be checked. CONSTITUTION:When a defect occurs during confirmation of the working of a device carried out by an electronic computer 101 to be checked, the defect data 102 is sent to a service processor 103. The processor 103 codes the defect and calculates the re-executing time point from the coding result. At the same time, the processor 103 sets the stop conditions at the computer 101. Then the processor 103 gives an instruction to the computer 101 for re-execution via a re-execution control signal 105. Thus the computer 101 performs the re- execution and then stops by the stop conditions. Then the processor 103 transfers the internal information 106 on the computer 101 to an electronic computer 107 whose working is already confirmed. The computer 107 studies the factor of the defect by means of a defect analyzing tool.
申请公布号 JPH0196740(A) 申请公布日期 1989.04.14
申请号 JP19870253653 申请日期 1987.10.09
申请人 HITACHI LTD 发明人 KINOSHITA YOSHIAKI;KAZAMA YOSHIHARU
分类号 G06F11/22 主分类号 G06F11/22
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