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发明名称
METHOD FOR MEASURING MIXED CRYSTAL RATIO OF COMPOUND SEMICONDUCTOR
摘要
申请公布号
JPH0194247(A)
申请公布日期
1989.04.12
申请号
JP19870252290
申请日期
1987.10.06
申请人
SUMITOMO ELECTRIC IND LTD
发明人
SHIRAKAWA FUTATSU;TAKEBE TOSHIHIKO;YAJIMA KUNIMITSU
分类号
G01N21/63;G01N21/64
主分类号
G01N21/63
代理机构
代理人
主权项
地址
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RESONATOR
