| 发明名称 |
WIDE ANGULAR RANGE X-RAY DIFFRACTION REFERENCE STANDARD |
| 摘要 |
<p>A unique composite structure is provided for calibration of diffractometer at low values of 2 theta . This composite structure involves a layer of silicon powder and a plurality of monolayers of a heavy metal stearate on the silicon powder. A lead stearate layered material has been found to provide significant results for enabling calibration below 20 DEG .</p> |
| 申请公布号 |
DE3379284(D1) |
申请公布日期 |
1989.04.06 |
| 申请号 |
DE19833379284 |
申请日期 |
1983.05.17 |
| 申请人 |
NORTH AMERICAN PHILIPS CORPORATION |
发明人 |
JENKINS, RONALD |
| 分类号 |
G01N23/207;G01N1/00;G01N1/28;G01N23/20;G21K1/06;(IPC1-7):G01N23/20 |
主分类号 |
G01N23/207 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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