| 摘要 |
A testing device for storing and/or processing of fault signals obtained from at least one transducer with associated electronic equipment, which fault signals are at least partially derived from one or more features, for example a defect on a test object, such as a steel blank. The fault signals are supplied to at least one discriminating circuit to distinguish between relevant and trivial fault signals. The relevant signals are then supplied to a plurality of different signal processing circuits which, for example, operate in parallel but independently.
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