发明名称 Method and device for measuring inside diameters using a laser interferometer and capacitance measurements
摘要 A method and device for measuring the distance between first and second positions on an inside surface of a metal part that includes locating a metal probe within the part, applying a voltage across the probe and part, measuring the capacitance between the probe and part, moving the probe toward the first position until a predetermined capacitance is measured, moving the probe toward the second position until the predetermined capacitance is measured, determining the distance travelled by the probe between the first and second positions, and adding to the determined distance a known value to compensate for the width of the probe and the distance between the probe and part when the predetermined capacitance is measured.
申请公布号 US4816744(A) 申请公布日期 1989.03.28
申请号 US19870050486 申请日期 1987.05.18
申请人 LASER METRIC SYSTEMS, INC. 发明人 PAPURT, DAVID M.;COHEN, DAVID A.
分类号 G01B7/13;G01R27/26;(IPC1-7):G01R27/26;G01B11/14 主分类号 G01B7/13
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