发明名称 NONVOLATILE MEMORY DEVICE
摘要 <p>PURPOSE:To attain a highly reliable storing action by stopping the supplying of a high voltage to a block when a leak to some a cell in the self-block occurs. CONSTITUTION:In a memory cell array 1, cells are divided into units of prescribed number of pieces that are made blocks B1-Bk, high-voltage lines 31-3k are allocated respectively to these blocks B1-Bk, and to each of these lines 31-3k, each of the high-voltage supply circuits 41-4k supplies a high voltage VHH from a high-voltage generation circuit 2 separately. The circuits 41-4k are made stop supplying the high voltage to a block when a leak to a cell in the self-block occurs. As a result, a leak to a cell in any one of the blocks does not influence cells in other blocks even if it actually occurs, hence the cells in other blocks can execute a complete action of storing data.</p>
申请公布号 JPS6478493(A) 申请公布日期 1989.03.23
申请号 JP19870233651 申请日期 1987.09.19
申请人 FUJITSU LTD 发明人 ARAKAWA HIDEKI
分类号 G11C17/00;G11C11/401;G11C11/407;G11C14/00;G11C16/06 主分类号 G11C17/00
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