发明名称 MANUFACTURE OF TANTALUM OXIDE THIN FILM
摘要 PURPOSE:To assure a high dielectric thin film having excellent insulating properties by doping the thin film with a group IV element in the periodic table after formation of the same by ion implantation. CONSTITUTION:A metal thin film 7 is deposited on a Si substrate 1 through a contact hole so as to extend to a peripheral insulating film 6. The thin film 7 is patterned into the configurations of electrodes and the like using a conventional photolithography process, on which tantalum oxide 8 is formed by a CVD technique. The formed tantalum is ion-implanted with Ti and Si. This yields the tantalum oxide 8 involving the group IV elements in the tantalum, assuring the tantalum 8 having excellent insulating properties.
申请公布号 JPS6471166(A) 申请公布日期 1989.03.16
申请号 JP19870228872 申请日期 1987.09.10
申请人 SHARP CORP 发明人 YAMAGISHI KOJI;MIYATAKE HISAKAZU
分类号 H01L27/04;H01L21/316;H01L21/822;H01L27/108 主分类号 H01L27/04
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