发明名称 |
MANUFACTURE OF TANTALUM OXIDE THIN FILM |
摘要 |
PURPOSE:To assure a high dielectric thin film having excellent insulating properties by doping the thin film with a group IV element in the periodic table after formation of the same by ion implantation. CONSTITUTION:A metal thin film 7 is deposited on a Si substrate 1 through a contact hole so as to extend to a peripheral insulating film 6. The thin film 7 is patterned into the configurations of electrodes and the like using a conventional photolithography process, on which tantalum oxide 8 is formed by a CVD technique. The formed tantalum is ion-implanted with Ti and Si. This yields the tantalum oxide 8 involving the group IV elements in the tantalum, assuring the tantalum 8 having excellent insulating properties. |
申请公布号 |
JPS6471166(A) |
申请公布日期 |
1989.03.16 |
申请号 |
JP19870228872 |
申请日期 |
1987.09.10 |
申请人 |
SHARP CORP |
发明人 |
YAMAGISHI KOJI;MIYATAKE HISAKAZU |
分类号 |
H01L27/04;H01L21/316;H01L21/822;H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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