发明名称 Arrangement for testing multiport optical waveguide components
摘要 In known attenuation test set-ups, for the purpose of measuring their individual internal port connections, multiport optical waveguide components are simultaneously coupled by means of two ports to the measuring arrangement and adjusted. This results in a correspondingly high number of necessary coupling and adjusting operations. This number is further doubled in the case of bidirectional components. In the arrangement according to the invention, the optical waveguide components (20) to be tested are coupled only once with all their entire ports (21...24) and adjusted. The different measurement paths between the ports (21...24) are controlled via a first and a second optical, controllable filtering/switching device, which preferably together form a compound network (VN) composed of optical relays (I, II) having three ports (a, b, c). Switching over and interchanging the optical measurement paths are performed in this case via the optical relays (I, II) of the compound network (VN). Continuity, assignment or attenuation tests of multiport, in particular bidirectional optical waveguide components. <IMAGE>
申请公布号 DE3724334(A1) 申请公布日期 1989.02.02
申请号 DE19873724334 申请日期 1987.07.20
申请人 SIEMENS AG 发明人 KROPP,JOERG-REINHARDT,DR.RER.NAT.
分类号 G01M11/00 主分类号 G01M11/00
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