| 摘要 |
An apparatus for testing printed circuits comprises a stack consisting of the test circuit (100), a first sheet (200, 201) of an elastic, anisotropically conductive material, conductive in the direction of its width and substantially insulating in the orthogonal directions; a printed circuit matrix card (300, 301) comprising, on the side nearer the printed circuit under test, a matrix of test plots directly opposite the N test points and, on the other side, N plots of resumption of contact each of which is connected to a test point; a second sheet (400, 401) of an elastic, anisotropically conductive material, arranged at least directly opposite the plot areas of the matrix card; and the treatment card (600, 601) which carries, on the side nearer the printed circuit, contact plots directly opposite the contact plots of the matrix card.
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