发明名称 Method of manufacturing a semiconductor device having a trench isolation region, and device manufactured by this method.
摘要 <p>The present invention provides a method of manufacturing a semiconductor having a trench region (25, 55). After an etching process for forming a trench region (25, 55) in a substrate (23, 53), the corners of the trench region are covered with a polycrystalline layer (27, 57). The structure is subjected to an oxidation treatment. As the polycrystalline layer covers the corners roundly, the corners are oxidized roundly. As a result, semiconductor islands (302, 502) having rounded corners are achieved.</p>
申请公布号 EP0296754(A2) 申请公布日期 1988.12.28
申请号 EP19880305465 申请日期 1988.06.15
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TAKAHASHI, KOUICHI C/O PATENT DIVISION;KINOSHITA, HIROSHI C/O PATENT DIVISION;MIYASHITA, NAOTO C/O PATENT DIVISION;SONOBE, HIRONORI C/O PATENT DIVISION
分类号 H01L21/76;H01L21/762;H01L21/763;H01L21/822;H01L27/04 主分类号 H01L21/76
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