发明名称 |
Method of manufacturing a semiconductor device having a trench isolation region, and device manufactured by this method. |
摘要 |
<p>The present invention provides a method of manufacturing a semiconductor having a trench region (25, 55). After an etching process for forming a trench region (25, 55) in a substrate (23, 53), the corners of the trench region are covered with a polycrystalline layer (27, 57). The structure is subjected to an oxidation treatment. As the polycrystalline layer covers the corners roundly, the corners are oxidized roundly. As a result, semiconductor islands (302, 502) having rounded corners are achieved.</p> |
申请公布号 |
EP0296754(A2) |
申请公布日期 |
1988.12.28 |
申请号 |
EP19880305465 |
申请日期 |
1988.06.15 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
TAKAHASHI, KOUICHI C/O PATENT DIVISION;KINOSHITA, HIROSHI C/O PATENT DIVISION;MIYASHITA, NAOTO C/O PATENT DIVISION;SONOBE, HIRONORI C/O PATENT DIVISION |
分类号 |
H01L21/76;H01L21/762;H01L21/763;H01L21/822;H01L27/04 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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