| 摘要 |
<p>PURPOSE:To enable prepn. of a defectless active matrix panel at a high yield by connecting the gate electrodes of two TFTs to a common scanning line and connecting the source electrodes to two adjacent signal lines. CONSTITUTION:The drain electrodes of the two TFTs 1 and 2 are commonly connected to a picture element 6 consisting of a picture element electrode 3, a common electrode 4 and a liquid crystal 4 sealed therebetween. The gate electrodes are also connected to the common scanning line Y1 but the source electrodes are connected to the respectively independent signal lines X1 and X2. Application of a normal signal to the picture element by cutting the defective TFT is thereby enabled if either of the two TFTs connected to the respective picture elements is normal. Since the defective TFT can be uniquely detected by an electrical inspection, the time required for the inspection and correction is shortened and the defectless active matrix panel is produced at the high yield.</p> |
