发明名称 METHOD FOR DETECTING MEMORY ABNORMALITY
摘要 PURPOSE:To improve the data processing efficiency by testing an entire memory related to the data processing with a single detection of the memory abnormality for detection of an abnormal memory and storing the address of said abnormal memory. CONSTITUTION:A means to test the overall normal/abnormal states of a memory related to the data processing when the abnormality of a memory occurs during the normal data processing and a means to store the position of the abnormal memory are provided. When the memory abnormality occurs and the data processing proceeds to an interruption process, the reading/writing actions are given to the entire memory related to the data processing for the test of the normal/abnormal states of the memory. Then the position of the detected abnormal memory is stored. Based on this detection data, an operator corrects the abnormality of the memory. Thus the entire abnormality of a memory is detected in response to the data processing just with a single detecting action of the memory. As a result, the data processing efficiency is improved.
申请公布号 JPS63285656(A) 申请公布日期 1988.11.22
申请号 JP19870122069 申请日期 1987.05.18
申请人 MITSUBISHI ELECTRIC CORP 发明人 SUGIYAMA TOSHINORI
分类号 G06F12/16 主分类号 G06F12/16
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