发明名称 SELF-TESTING MEMORY
摘要 <p>A self-testing memory simultaneously writes test patterns into the memory banks of the memory, simultaneously compares the contents of one of the memory banks with the contents of the other of the banks, and records errors when the contents of the one memory bank differ from the contents of the other banks.</p>
申请公布号 WO1988009038(A1) 申请公布日期 1988.11.17
申请号 US1987001547 申请日期 1987.06.30
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