| 摘要 |
<p>A constant power source (20) of electromagnetic energy is applied to a device under test (10). The device under test (10) is terminated alternately by first and second unknown loads (26, 28) having a low power reflection characteristic. While the device is terminated by each of the loads the input and reflected power at the input (14) and output (18) terminals of the device under test (10) is measured to obtain first and second sets of measured values. The measured values are then used to calculate the S-parameters of the device under test.</p> |
