| 摘要 |
PURPOSE:To enable inspection using an IC tester and to obtain an accurate inspection result by forming a through-hole for inspection on a wiring pattern when detecting both ends of the wiring pattern being pads for surface mounted components. CONSTITUTION:An input/output device 1 inputs and outputs various data such as wiring pin pair information containing information on input/output terminals at both ends of the wiring pattern, i.e. information on circuit components having the input/output terminals, and an arithmetic processor 2 processes the various data inputted from the input/output device 1 as required. The processing result of the arithmetic processor 2 is stored in a data storage device 3 and the through-hole is formed on the wiring pattern according to the wiring pin pair information generated by a pattern generating mechanism 4. This pattern generating mechanism 4 consists of a through-hole decision part 41 which decides a pin pair regarding the pads for surface mounted components from the wiring pin pair information, a through-hole which generates the through-hole on the wiring pattern, and a wiring pattern generation part 43 which generates the wiring pattern.
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