| 摘要 |
PURPOSE:To process easily a measured value by providing a memory part partially with a storage area for compensating an error difference of a measured value with time due to a difference in electric characteristic. CONSTITUTION:A delay line T1 whose value is known is interposed between the IN1 and OUT1 of a part 6 to be measured, relays K1, K2, and K7 are closed to trigger a signal generation part 3, and a measurement is taken by voltage detectors 7 and 10; and the voltage detectors 7 and 10 are so adjusted that the measured value is T1, and zero is stored in addresses N+0 and N+6 in a table. Similarly, the voltage detectors 7 and 10 are so adjusted that a measured value on the minus pulse polarity is T2, and zero is stored in the addresses N+1 and N-1. Further, the delay lines T1 is inserted between the IN2 and OUT1, IN3 and OUT1, IN1 and OUT2, and IN1 and OUT3 of the part 6 to be measured, and similar tests are taken to store differences between measured values and T1 and T2 as characteristic offsets successively. During the testing operation, the contents of the memory are added to calculate a real measured value; the need to equalize strictly the electric characteristics of an input voltage discriminator to those of an output voltage discriminator is eliminated and an excellent measured value is obtained without making strictly the length of a pulse line coincident. |
