发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE:To prevent the occurrence of a latch-up phenomenon even when a power source is turned on by a method wherein the output terminal of a substrate bias generating circuit is short-circuited to a grounding level for the prescribed period after the power source has been turned on. CONSTITUTION:The title integrated circuit has the first N-channel type MOS transistor Q3 and the second N-channel type MOS transistor Q4 having the threshold voltage lower than that of the transistor Q3. At this point, a high level pulse signal is generated during the prescribed period after a power source is turned on. As high level voltage is applied to the gate of the first transistor Q3 through the intermediary of a capacitor 2, the first transistor Q3 becomes conductive for the prescribed period immediately after the power source is turned on, and the main section (time t2-t3), in which the potential VPB of an output terminal PBB indicates a positive value, is forcedly clamped 0V. Consequently, the occurrence of a latch-up phenomenon can be prevented.
申请公布号 JPS63255958(A) 申请公布日期 1988.10.24
申请号 JP19870091211 申请日期 1987.04.13
申请人 MITSUBISHI ELECTRIC CORP 发明人 OZAKI HIDEYUKI
分类号 H01L27/04;G11C11/407;H01L21/822;H01L27/08;H01L27/092;H01L27/10 主分类号 H01L27/04
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