发明名称 TEMPERATURE TESTING DEVICE
摘要 PURPOSE:To save the labor for a temperature test and to make temperature test contents single by performing temperature control automatically and turning on the power source of a device to be tested at an optional point of time combined with the temperature control. CONSTITUTION:A program setter 1 sends set temperature and time width information to a temperature control mechanism 2 with time from the start of the temperature test. The mechanism 2 performs the temperature control while receiving data fed back from an environment sensor 15 so that the temperature in the temperature testing device 9 reaches set temperature according to the accuracy. The setter 1 sends out a power-on signal set corresponding to the progress extent of a program to a power-on/off mechanism 4 independently of the temperature control. The mechanism 4 controls the power-on/off operation of a central processor 8 during the temperature test according to said signal. here, when a power-on signal sent out of the setter 1 is false, the power source of the processor 8 is turned off and when the power-on signal becomes true, the power source of the processor 8 is turned on.
申请公布号 JPS63256838(A) 申请公布日期 1988.10.24
申请号 JP19870090792 申请日期 1987.04.15
申请人 HITACHI LTD;HITACHI COMPUTER ELECTRON:KK 发明人 MOTOJI MANABU;GOTOU MASA;HOSHINO KOICHI
分类号 G01N17/00 主分类号 G01N17/00
代理机构 代理人
主权项
地址