发明名称 PATTERN DETECTOR
摘要 PURPOSE:To obtain an accurate, high-efficiency positioning device by projecting a variable-length elliptic spot on an object which has a pattern. CONSTITUTION:Luminous flux emitted by a light source 4 is collimated by a collimator lens 5 into parallel luminous flux to form an elliptic spot on the object 10 through a cylindrical lens 8, and then scattered light is detected by a couple of detectors 11. Here, the diaphragm which consists of a fixed aperture 6 and apertures 7 and 7' capable of shifting in position in a generator direction is interposed in the luminous flux from the lens 5 to vary the lengthwise length of the elliptic spot formed on the object 10. Consequently, even if the wafer has a rotation-directional position error, the spot is not projected on the pattern of a chip when the spot reaches a street line by making the lengthwise length of the spot 3 nearly equal to one side of the chip; and a clear maximal value appears in the photoelectric signal of the scattered line and the street line is clearly detected.
申请公布号 JPS63247603(A) 申请公布日期 1988.10.14
申请号 JP19870081957 申请日期 1987.04.02
申请人 NIKON CORP 发明人 SASAYA TOSHIHIRO;OZAWA HARUO;KURAMOCHI KAZUO;MIYAJI AKIRA
分类号 G01B11/00;G03F7/20;H01L21/027;H01L21/30;H01L21/68 主分类号 G01B11/00
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