发明名称 SEMICONDUCTOR INPUT PROTECTIVE DEVICE
摘要 PURPOSE:To achieve the input protection of a substrate bias generating circuit without deteriorating the characteristics of the substrate bias generating circuit by connecting the input gate of a transistor to the output terminal of the substrate bias generating circuit. CONSTITUTION:The gate and source of an input protective transistor 20 are connected to the output terminal 7 of a substrate bias generating circuit and the drain of the transistor 20 is connected to a reference potential 6. When a potential much lower than a substrate bias potential is applied to the external terminal 7 of the substrate bias generating circuit, a current is applied by the breakdown characteristics mainly of an input protective transistor 21 or of the other input protective transistor 20 to protect the substrate bias generating circuit. When a potential higher than the reference voltage 6 is applied to the external terminal 7 of the substrate bias generating circuit, a current is applied by turning mainly the input protective transistor 20 or the other input protective transistor 21 ON the suppress the potential to the reference potential 6 or the potential of an electric source 8 to protect the substrate bias generating circuit.
申请公布号 JPS63244872(A) 申请公布日期 1988.10.12
申请号 JP19870078713 申请日期 1987.03.31
申请人 TOSHIBA CORP;TOSHIBA MICRO COMPUT ENG CORP 发明人 UCHIDA KAZUYUKI;SAEKI YUKIHIRO;NAKAMURA HIROAKI
分类号 H01L29/78;H01L21/8234;H01L27/02;H01L27/088 主分类号 H01L29/78
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