发明名称 APPARATUS FOR INSPECTING ELECTRONIC COMPONENT
摘要 PURPOSE:To ensure efficient inspection while minimizing the down time due to troubles, by transferring electronic components first with their lead sections on the upside so that they are inspected whether leads are bent inward or outward and then transferring only the components without such defect after turning them over so that they are inspected with respect to other items. CONSTITUTION:IC's 1 are transferred along a horizontal transfer path 17 with their lead sections 1a on the upside, so that the lead sections 1a of the IC's 1 thus transferred are inspected whether leads are bent inward or outward. Defective IC's if any are removed from the line and only the IC's without such defect are supplied to a horizontal transfer path 24 after they are turned over at a turn-over section 23. The IC's 1 are transferred along the horizontal transfer path 24 with their lead sections 1a on the down side, so that the IC's are inspected whether they have any defect with respect to their marks, molding or leads. In this manner, efficient inspection is ensured even if IC's having lead sections 1a bent inward or outward are transferred along the line.
申请公布号 JPS63241943(A) 申请公布日期 1988.10.07
申请号 JP19870074150 申请日期 1987.03.30
申请人 TOSHIBA CORP 发明人 KUBOTA TORU
分类号 H01L21/66;G01N21/88;G01N21/956;H05K13/08 主分类号 H01L21/66
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