发明名称 |
INSTRUMENT FOR MEASURING THERMAL PROPERTY OF THIN FILM-LIKE MATERIAL |
摘要 |
PURPOSE:To permit exact measurement and evaluation of the thermal diffusivity of a thin film by providing a sample holder, heat source part and temp. measuring part. CONSTITUTION:A band-shaped thin film sample 1 is horizontally held by the sample holder 16 in such a manner that the center thereof does not lower. A laser light source which is the heat source is provided atop the sample 1 and the laser light 14 thereof is condensed by a slit 15 and is so adjusted that the linear laser light is projected to the sample 1 across the same. An optical system 18 for temp. measurement is then so adjusted that the radiation released from the very small part of the sample 1 is imaged to a detector 17. The inside of a chamber in which these measuring systems are fully housed is then evacuated by using an evacuation device. Impulsive light is released when the entire system attains a constant temp. The temp. measurement is started in synchronization therewith. The thermal diffusivity is determined from the measured temp. distribution, by which the exact measurement and evaluation thereof are permitted.
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申请公布号 |
JPS63241457(A) |
申请公布日期 |
1988.10.06 |
申请号 |
JP19870074535 |
申请日期 |
1987.03.30 |
申请人 |
KAWASAKI STEEL CORP;WASEDA YOSHIO;OTA HIROMICHI |
发明人 |
OOTA TOMOHIRO;SASAKI HIROAKI;KAKIO YASUHIRO;WASEDA YOSHIO;OTA HIROMICHI |
分类号 |
G01N25/18 |
主分类号 |
G01N25/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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