发明名称 INSTRUMENT FOR MEASURING THERMAL PROPERTY OF THIN FILM-LIKE MATERIAL
摘要 PURPOSE:To permit exact measurement and evaluation of the thermal diffusivity of a thin film by providing a sample holder, heat source part and temp. measuring part. CONSTITUTION:A band-shaped thin film sample 1 is horizontally held by the sample holder 16 in such a manner that the center thereof does not lower. A laser light source which is the heat source is provided atop the sample 1 and the laser light 14 thereof is condensed by a slit 15 and is so adjusted that the linear laser light is projected to the sample 1 across the same. An optical system 18 for temp. measurement is then so adjusted that the radiation released from the very small part of the sample 1 is imaged to a detector 17. The inside of a chamber in which these measuring systems are fully housed is then evacuated by using an evacuation device. Impulsive light is released when the entire system attains a constant temp. The temp. measurement is started in synchronization therewith. The thermal diffusivity is determined from the measured temp. distribution, by which the exact measurement and evaluation thereof are permitted.
申请公布号 JPS63241457(A) 申请公布日期 1988.10.06
申请号 JP19870074535 申请日期 1987.03.30
申请人 KAWASAKI STEEL CORP;WASEDA YOSHIO;OTA HIROMICHI 发明人 OOTA TOMOHIRO;SASAKI HIROAKI;KAKIO YASUHIRO;WASEDA YOSHIO;OTA HIROMICHI
分类号 G01N25/18 主分类号 G01N25/18
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