发明名称 FINE PROCESSING METHOD
摘要 PURPOSE:To prevent disturbance of an etching process shape and deterioration of quality of a base insulating film and the like, which are caused by electrification of a mask, by using a conductive ceramic material as a mask material. CONSTITUTION:Since a mask 15 is conductive, charges flowing into the mask 15 escape to an earth terminal or the like via a polycrystal silicon film 14. Though an escaping path for electrons is lost when the polycrystal silicon film 14 is completely etched, the electrons continue to escape until the polycrystal silicon film 14 is completely isolated and so electrons accumulated in the mask are very few. Discharge or so of the electrons accumulated in the mask does not occur between the mask 15 and the substrate 11, so that deterioration of characteristic and so of the base SiO2 film 13 can be prevented from occurring.
申请公布号 JPS63237531(A) 申请公布日期 1988.10.04
申请号 JP19870072123 申请日期 1987.03.26
申请人 TOSHIBA CORP 发明人 ARIKADO TSUNETOSHI
分类号 H01L21/302;H01L21/3065 主分类号 H01L21/302
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