摘要 |
PURPOSE:To measure the profile of a charged particle beam even when a measuring instrument is used in an intense magnetic field by using light emitted when a charged particle beam strikes on a photomultiple wire. CONSTITUTION:When a fast electron beam impinges on the photomultiple wire 1, respective optical fiber wires which constitute the photomultiple wire 1 emit Cherenkov light. The intensity of the emitted Cherenkov light is proportional to the number of electrons striking on the wire. The Cherenkov light from the respective optical fibers 2 is inputted to light emitting diodes 3 respectively and converted into electric signals. The electric signals from the respective light emitting diodes 3 are multiplexed by an analog multiplexer 4, sent to a computer through an analog-digital converter 5, and processed. The computer finds the profile of the electron beam according to the Cherenkov light from the photomultiple wire 1. Namely, the intensity distribution in beam section is obtained.
|