发明名称 DEFECT OBSERVING METHOD FOR CERAMIC MEMBER
摘要 PURPOSE:To observe the development of a defect part with high accuracy and to easily find a material constant by photographing a defect part as an image by radiation transmission while stressing a ceramics member, and calculating a feature quantity corresponding to the kind of the defect part. CONSTITUTION:The progress state of the defect part of the ceramics material member 1, e.g. a crack 3 made in the ceramics member 1 in tension mode is picked up as an image by using an X ray, etc., while a tensile load is placed. Then the image of only the crack 3 is obtained and the crack is observed in real time. The obtained image is processed to find, for example, a stress expansion coefficient.K1-crack growing speed.V curve, and a critical stress expansion coefficient.KIC value, etc., can be quantized. Consequently, the development of the crack 3 is observed with high accuracy and the material constant is easily found.
申请公布号 JPS63238541(A) 申请公布日期 1988.10.04
申请号 JP19870071668 申请日期 1987.03.27
申请人 TOSHIBA CORP 发明人 TANAKA SHUNICHIRO
分类号 G01N23/04;G01N23/18 主分类号 G01N23/04
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