发明名称 SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 PURPOSE:To decrease remaining burr between leads and to decrease defects due to the burr in the next step, by providing a buffer member between punches and the burr when cracks are yielded in the burr by a first means. CONSTITUTION:A molded IC lead frame 2 is sent to a first stage, which is a first means for yielding cracks in burr 3. Resin punches 4 and a buffer member 6 are lowered so as to push the IC lead frame 2, and the cracks are yielded in the burr 3 between leads. The frame is sent to a second stage, which is a second means, and ordinary deburring is performed. Then the cracks can be yielded with shocks imparted to the part of the burr 3 being alleviated with the buffering action of the member 6. Thus the remaining burr between the leads is decreased, and the defects due to the burr in the next step is decreased.
申请公布号 JPS63233538(A) 申请公布日期 1988.09.29
申请号 JP19870069414 申请日期 1987.03.23
申请人 MITSUBISHI ELECTRIC CORP 发明人 UEO NORIYUKI;UENO SUMIO
分类号 B29C37/02;B29L31/34;H01L21/56 主分类号 B29C37/02
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