DEFECT LEAKAGE SCREEN SYSTEM

摘要

Defect Leakage Screen System A test circuit or system is provided wherein data is stored in circuits or cells of an array or matrix with the use of conventional or normal operating voltages. Voltages at internal nodes of the circuits or cells are altered to magnitudes beyond the normal operating ranges, which includes significantly decreasing the offset voltage, for a short period of time and then the stored data is read out at normal-voltages and currents and compared with the data written into the circuits or cells.