发明名称 Arrangement for the total reflection of X-radiation
摘要 The method for the total reflection of X-radiation is used inter alia for the monochromatisation of long-wave radiation in X-ray spectrometers with parallel beam path. By inserting an arrangement with a plurality of single mirrors arranged in plane-parallel manner at specific distances above one another, the loss of brightness caused by the very small limiting angle (angle of incidence) is compensated. Arrangements of this type can be compared with collimators which exert additional monochromatising effect and influence the spectrum qualitatively.
申请公布号 DE3804798(A1) 申请公布日期 1988.09.15
申请号 DE19883804798 申请日期 1988.02.16
申请人 FREIBERGER PRAEZISIONSMECH 发明人 MIERSCH, HELFRIED, DIPL.-PHYS., DDR 9200 FREIBERG, DD
分类号 G21K1/06;(IPC1-7):G21K1/06;G01N23/00;G01T1/36 主分类号 G21K1/06
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