MEASURING DEVICE FOR THE CONTACTLESS MEASUREMENT OF LARGE THICKNESSES, FOR METAL MATERIALS ABOVE THE CURIE TEMPERATURE,申请号EP19840200819-传众专利搜索

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发明名称	MEASURING DEVICE FOR THE CONTACTLESS MEASUREMENT OF LARGE THICKNESSES, FOR METAL MATERIALS ABOVE THE CURIE TEMPERATURE
摘要
申请公布号	EP0129282(B1)	申请公布日期	1988.09.07
申请号	EP19840200819	申请日期	1984.06.08
申请人	CISE- CENTRO INFORMAZIONI STUDI ESPERIENZE S.P.A.;INNSE INNOCENTI SANTEUSTACCHIO S.P.A.;DALMINE S.P.A.	发明人	CARUSO, EUGENIO;GRAY, ANTONIO
分类号	G01B7/00;G01B7/06;(IPC1-7):G01B7/10	主分类号	G01B7/00
代理机构		代理人
主权项
地址

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