发明名称 Bipolar transistor fabrication utilizing CMOS techniques.
摘要 <p>Disclosed is a bipolar transistor and a method of fabrication thereof compatible with MOSFET devices. A transistor intrinsic base region (54) is formed in the face of a semiconductor well (22), and covered with a gate oxide (44). The gate oxide (44) is opened, and doped polysilicon is deposited thereover to form a polyemitter structure (68) in contact with the base region (54). Sidewall oxide (82, 84) is formed on the polyemitter structure (60). A collector region (90) and an extrinsic base region (100) are formed in the semiconductor well (22) and self aligned with respect to opposing side edges of the polyemitter sidewall oxide (82, 84).</p>
申请公布号 EP0281235(A1) 申请公布日期 1988.09.07
申请号 EP19880300586 申请日期 1988.01.25
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 SPRATT, DAVID;SHAH, RAJIV R.
分类号 H01L27/06;H01L21/331;H01L21/8222;H01L21/8249;H01L29/73;H01L29/732;(IPC1-7):H01L21/82;H01L21/285;H01L29/72 主分类号 H01L27/06
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