Sensitivity-calibration circuit for use in an absorption analyzer

摘要

A sensitivity calibration circuit for use in an absorption analyzer provided with a check-signal generator for easily checking the sensitivity, includes a temperature compensating circuit for use in an optical system for compensating for a temperature draft due to said optical system and a temperature compensation circuit for use in a sample system for compensating for a temperature draft due to the sample system. The temperature compensation circuit for use in an optical system and the temperature compensation circuit for use in a sample system are separately provided and a switch is provided which is switchable to a measuring state in which both the temperature compensation circuit for use in an optical system and the temperature compensation circuit for use in a sample system are used and is switchable to a checking state in which the temperature compensation circuit for use in a sample system is disconnected so as not to be used but the temperature compensation circuit for use in an optical system is used.