发明名称 MANUFACTURE OF COMPOUND SEMICONDUCTOR DEVICE
摘要 Submicron structure fabrication is accomplished by providing vapor chemical erosion of a compound crystal by suppressing the more volatile elements so that the less volatile element is provided with an anti-agglomeration and erosion rate limiting capability which can be followed by subsequent regrowth in the same environment. The erosion is sensitive to crystallographic orientation.
申请公布号 JPS63202916(A) 申请公布日期 1988.08.22
申请号 JP19880000802 申请日期 1988.01.07
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 ERITSUKU ROI FUOOSAMU;PIITAA DANIERU KAAKUNAA;JIYOOJI DEIBITSUDO PETEITSUTO;ARAN KURAAKU UOORIN;JIERII MATSUKUFUAASUN UTSUDOORU
分类号 H01L21/302;H01L21/20;H01L21/263;H01L21/306;H01L21/3065 主分类号 H01L21/302
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