| 摘要 |
PURPOSE:To simultaneously measure a plurality of electronic circuits each having a small number of pins without adding hardware, by respectively providing a plurality of comparators and a plurality of memory parts and arbitrarily combining them by software. CONSTITUTION:The pattern from a pattern generating part 1 is supplied to an electronic circuit through a pattern driver 3 and inputted to a level comparator 7 through a buffer circuit 6. This output pattern is compared with the expectation value pattern from the pattern generating part 1 by a pattern comparator 8 and the result thereof is transmitted to a judge result recording part 9. At this time, when 10 judge circuits are used with respect to one electronic circuit to be measured, the remaining 38 judge circuits are allotted to the other electronic circuit to be measured. The result at every judge circuit is collected at every circuit to be measured to perform the judgement of quality in a controller 10A and a judge result is displayed on a display part 11A corresponding at each electronic circuit to be measured.
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