发明名称 PLASMA TREATMENT DEVICE
摘要 PURPOSE:To permit a good plasma treatment by connecting a bias voltage source between an electrode to be imposed with a substrate and grounding potential source and regulating the ion energy of a plasma part. CONSTITUTION:High-frequency electric power is supplied from a high-frequency oscillator 3 to capacity type coupling electrodes 10, 11 disposed to confront each other in a vacuum vessel 5. Plasma discharge 9 of gas in the vacuum vessel 5 is generated between the two electrodes 10 and 11 by said electric power. The substrate 6 imposed on the electrode 11 is subjected to a deposition or etching treatment by the ions of the plasma in the generated plasma part 9. The bias voltage source 14 is disposed between the electrode 11 and earth potential 8 of the above-mentioned plasma treatment device. The ion energy of the ions when the ions arrive at the substrate 6 is adjusted by changing the bias voltage. The satisfactory deposition or etching with decreased defects is thereby permitted.
申请公布号 JPS63190162(A) 申请公布日期 1988.08.05
申请号 JP19870292004 申请日期 1987.11.20
申请人 HITACHI LTD 发明人 TSUCHIMOTO TAKASHI
分类号 H05H1/46;C23C14/22;C23C14/24;C23C14/40;C23F4/00 主分类号 H05H1/46
代理机构 代理人
主权项
地址