发明名称 |
Rapid thermal chemical vapour deposition apparatus. |
摘要 |
<p>In a chemical vapor deposition apparatus for coating semiconductor wafers, the wafer is held face down in the reaction chamber. A radiant heat source above the wafer and outside the reaction chamber heats the wafer from its backside of a temperature in excess of 1000 DEG C rapidly. In the selective tungsten process the temperature of the wafer is raised from ambient to about 600 DEG C while flowing process gases. At the upper temperature range the heating source can be rapidly cycled on and off to improve the uniformity of coating.</p> |
申请公布号 |
EP0276061(A1) |
申请公布日期 |
1988.07.27 |
申请号 |
EP19880300152 |
申请日期 |
1988.01.08 |
申请人 |
VARIAN ASSOCIATES, INC. |
发明人 |
BRORS, DANIEL L.;LANE, LARRY R.;GOLDSBOROUGH, MARK W.;SAMSEL, JASON M.;VAN MASTRIGT, MAX;FOSTER, ROBERT |
分类号 |
H01L21/285;C23C16/46;C23C16/48;C23C16/54;H01L21/205;(IPC1-7):C23C16/46 |
主分类号 |
H01L21/285 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|