发明名称 RESIST DEVELOPER
摘要 PURPOSE:To control a temp. of a processing laboratory at an optionally set temp. with high accuracy by supplying a heating medium which is kept at a constant temp. through the heating medium supplying means for heat-exchange chambers located between inside and outside walls of a developing vessel, thereby arranging a control means of chemicals in a heat insulation room. CONSTITUTION:Heat exchange chambers 14e, 14f, and 14g where a heating medium passes are formed between inside and outside walls of a developing vessel 500. Then, even though an outside temp. is higher than a setting temp. of a processing laboratory 10, its temp. of the processing laboratory 10 can be controlled at a desired setting temp. with high accuracy without being affected by various conditions of the outside temp. Then development of each wafer W from the first sheet to the required several sheets is performed without producing the scattering of sensitivity. Further, heat exchange coils 600a, 600b, and 600c for adjusting a temp. of a developing solution are prepared in the heat exchange chamber 14e which controls an atmosphere temp. of the processing laboratory 10. Then s valve and others for controlling chemical materials are arranged in a heat insulation room 603 that is surrounded by insulation members 602 and its insulation room allows the valves 802 and 803 to come in contact with a piping 876 where the heating medium passes. Then the developing solution does not produce the scattering of its temp.
申请公布号 JPS63177519(A) 申请公布日期 1988.07.21
申请号 JP19870011056 申请日期 1987.01.19
申请人 DAIKIN IND LTD 发明人 TAKEI TOSHITAKA;FUNATSU TSUNEMASA
分类号 H01L21/30;G03F7/00;G03F7/30;H01L21/027 主分类号 H01L21/30
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