发明名称 Method of forming an improved gate dielectric for a MOSFET on an insulating substrate
摘要 A method for forming a silicon dioxide layer on a silicon island on an insulating substrate includes the steps of initially providing an insulating substrate having a major surface on which a silicon island is disposed. The surface of the silicon island is then thermally oxidized and a silicon layer is deposited on the oxidized island and the portion of the substrate surface adjacent to the island. This entire silicon layer is then oxidized and a conductive polycrystalline silicon electrode is deposited thereon.
申请公布号 US4758529(A) 申请公布日期 1988.07.19
申请号 US19850793312 申请日期 1985.10.31
申请人 RCA CORPORATION 发明人 IPRI, ALFRED C.
分类号 H01L27/12;H01L21/336;H01L21/86;H01L29/78;H01L29/786;(IPC1-7):H01L21/473 主分类号 H01L27/12
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