发明名称 MEASUREMENT OF DETECT USING X-RAY CT APPARATUS
摘要 PURPOSE:To achieve a higher efficiency of measuring work with a reduction in the photographing time while facilitating the discrimination of a defect or the like, by measuring a false defect part with a lowered ray source voltage after the preparation of an X ray transmission image with the heightening of the ray source voltage. CONSTITUTION:X rays with a high intensity are generated with the heightening of a ray source voltage of an X rays generator 4 to irradiate an object 6 to be inspected in a short time and the transmission X rays are detected with a detector 18. A detection signal of the detector undergoes an arithmetic processing with a computer 10 to form a transmission image 13, which is displayed on an image display device 11 to discriminate the presence of a defect. Then, with the lowering of the ray source voltage, a false defect part is irradiated with X rays for a specified time to measure and an image 13 clear with a high contrast is obtained. This enables measurement of the state of a defect easily in a short time.
申请公布号 JPS63168545(A) 申请公布日期 1988.07.12
申请号 JP19870000126 申请日期 1987.01.06
申请人 TOSHIBA CORP 发明人 FUJII KENICHI
分类号 G01N23/04;A61B6/03;G01B15/00;G01B15/04;G01N23/18 主分类号 G01N23/04
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