COMPUTER-AIDED PROBE WITH TRISTATE CIRCUITRY TEST CAPABILITY

摘要

A probe is connected to a tri-state circuit which generates a programmable dc voltage to be impressed on a circuit node by the probed tip. Memory is provided for storing any change in tip voltage signifying a fault in the tri-state test. A separate circuit detects programmable data levels to eliminate gray area ambiguities. Further, a quick-check circuit determines whether a node is short circuited by determining whether toggling can occur at a node.