发明名称 FOREIGN MATTER DETECTING DEVICE
摘要 <p>PURPOSE:To stably and quickly detect a foreign matter by detecting a reflected light from an area to be detected, illuminated by a band-shape lighting means, by a lens array, a light shielding means for making an aperture variable, and a photoelectric transducer. CONSTITUTION:A band-shape lighting means 4 is provided on the surface of a pellicle 3 which becomes an object to be inspected, and illuminates on the pellicle 3 in a band shape. On this band-shape lighting area, a lens array 6 on which an image forming lens being minute, and also, executing a parabolic refracting distribution is arranged at a small pitch is placed. This lens array 6 projects a scattered light image by a foreign matter existing at the band-shape lighting area, to the photoelectric transducer 8. Therefore, a foreign matter inspection can be executed by the same sensitivity at the center of the pellicle 3 and its periphery. Also, on the pellicle side of the photoelectric transducer 8, a light shielding part 7 making the aperture variable in accordance with the shape and the size of the pellicle is provided. This light shielding part 7 prevents a stray light such as a reflected light etc., from a pellicle frame 2, from being made incident on the photoelectric transducer 8, and a stable foreign matter inspection can be attained.</p>
申请公布号 JPS63153451(A) 申请公布日期 1988.06.25
申请号 JP19860299916 申请日期 1986.12.18
申请人 HITACHI LTD 发明人 UTO YUKIO;KOIZUMI MITSUYOSHI;OSHIMA YOSHIMASA
分类号 H01L21/66;G01N21/94;G01N21/956;G03F1/62;H01L21/027 主分类号 H01L21/66
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